Application of Doehlert matrix to the study of flow injection procedure for selenium (IV) determination.
Identifieur interne : 003134 ( Main/Exploration ); précédent : 003133; suivant : 003135Application of Doehlert matrix to the study of flow injection procedure for selenium (IV) determination.
Auteurs : RBID : pubmed:18969538Abstract
A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I(3)(-). A Doehlert matrix was applied for the determination of the optimal working conditions. With the developed method, a linear calibration curve from 1 to 10ppm was obtained. For the analysis of semiconducting thin layers of CuInSe(2) (CIS), a cationic resin was added to the sample solution in order to eliminate the effect of copper and indium on the absorbance values. With the developed procedure a sample throughput of 36 samples per hour and a relative standard deviation 1.1% was achieved.
DOI: 10.1016/j.talanta.2004.01.011
PubMed: 18969538
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Le document en format XML
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<author><name sortKey="Hellal, F" uniqKey="Hellal F">F Hellal</name>
<affiliation wicri:level="1"><nlm:affiliation>Département de Chimie, Institut National des Sciences Appliquées et de Technologie, B.P. 676, Tunis Cedex 1080, Tunisia; Département de Chimie, Laboratoire de Chimie Analytique et Electrochimie, Faculté des Sciences de Tunis, Campus Universitaire, 1060 Tunis, Tunisia.</nlm:affiliation>
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<author><name sortKey="Dachraoui, M" uniqKey="Dachraoui M">M Dachraoui</name>
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<front><div type="abstract" xml:lang="en">A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I(3)(-). A Doehlert matrix was applied for the determination of the optimal working conditions. With the developed method, a linear calibration curve from 1 to 10ppm was obtained. For the analysis of semiconducting thin layers of CuInSe(2) (CIS), a cationic resin was added to the sample solution in order to eliminate the effect of copper and indium on the absorbance values. With the developed procedure a sample throughput of 36 samples per hour and a relative standard deviation 1.1% was achieved.</div>
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<Abstract><AbstractText>A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I(3)(-). A Doehlert matrix was applied for the determination of the optimal working conditions. With the developed method, a linear calibration curve from 1 to 10ppm was obtained. For the analysis of semiconducting thin layers of CuInSe(2) (CIS), a cationic resin was added to the sample solution in order to eliminate the effect of copper and indium on the absorbance values. With the developed procedure a sample throughput of 36 samples per hour and a relative standard deviation 1.1% was achieved.</AbstractText>
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